| 2020/07/29 |
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PCN(Product Change Notice)
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Notification# 20200715000 Datasheet for LMV321, LMV324, LMV358 Information Only |
| 2020/08/17 |
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PCN(Product Change Notice)
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12500 TI Boulevard, MS 8640, Dallas, Texas 75243
Notification# 20200715000 Datasheet for LMV321, LMV324, LMV358 Information Only
The datasheet number will be changing. Device Family: LMV321, LMV324, LMV358 Change From: SLOS263W Change To: SLOS263X
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| 2021/12/20 |
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PCN(Product Change Notice)
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Texas Instruments Incorporated is announcing the qualification of additional Assembly sites |
| 2021/12/20 |
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PCN(Product Change Notice)
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TEXAS INSTRUMENTS Revised PCN/PDN information The target product has been added. [Initial notification content] For the target products, add CDATE and TIME to the post-processing factory. Expected effective date: December 20, 2021 |
| 2023/08/31 |
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PCN(Product Change Notice)
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Revision B is to remove devices in the Product Affected Section. This device will continue to be manufactured as prior and will not be subjected to the change described in this notification. |
| 2024/02/06 |
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PCN(Product Change Notice)
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Supplier Notice No.:20240203000.0 Title: Pin one Device symbolization update for Select SOT Devices
Description of Change: Texas Instruments Incorporated is announcing an update to the pin one designator on select SOT devices as follows: Current:Pin One Stripe only Proposed:Pin One Stripe or Pin one Dot Following this notification, devices can be shipped with either the pin one stripe or the pin 1 dot.
Reason for Change: Improved internal traceability
Anticipated impact on Fit, Form, Function, Quality or Reliability (positive / negative): Device marking change only |
| 2024/02/13 |
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PCN(Product Change Notice)
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Supplier Notice No.:20240203000.0#1 Title: Pin one Device symbolization update for Select SOT Devices
Description of Change: Texas Instruments Incorporated is announcing an update to the pin one designator on select SOT devices as follows: Current:Pin One Stripe only Proposed:Pin One Stripe or Pin one Dot
Reason for Change: Improved internal traceability
Anticipated impact on Fit, Form, Function, Quality or Reliability (positive / negative): Device marking change only |