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Quick Learning: Single shot avalanche ruggedness
Nexperia
Electronic applications have progressed significantly in recent years and have inevitably increased the demand for an intrinsically rugged power MOSFET. Device ruggedness is defined by the capacity of a device to sustain an avalanche current during an unclamped inductive load switching event. Join Andrew Berry as he explains this happening and the importance behind reading the MOSFET datasheet.
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